Advanced Electronic Circuit Design 1

Singapore University of Social Sciences

Advanced Electronic Circuit Design 1 (ENG331)

Synopsis

This advanced course in electronic circuit design delves into the intricacies of creating highperformance electronic systems. Building upon foundational electronics knowledge, this course accentuates the essential techniques and methodologies required for sculpting complex circuits ubiquitous in modern electronic devices and systems. From delving into CMOS circuit design to mastering CMOS combinational logic and sequential logic designs and FPGA prototyping, students will navigate a spectrum of topics. Additionally, students will learn chip testing methodologies and performance evaluation techniques. Through a blend of theoretical discourse, immersive laboratory sessions, and project-based learning, students will cultivate the skills indispensable for designing, testing, and evaluating sophisticated electronic circuits across diverse applications.

Level: 3
Credit Units: 5
Presentation Pattern: EVERY JULY

Topics

Introduction to Integrated Circuit Design
CMOS Circuit Design
Chip Design and Implementation
CMOS Combinational Logic Design
CMOS Sequential Logic Design
FPGA Architecture and Design Methodologies
Prototyping Electronic Circuits with FPGAs
Chip Testing Techniques and Methodologies
Performance Evaluation and Optimisation Strategies
Design Verification and Validation Techniques
Advanced Simulation Tools for Circuit Design
Case Studies in Advanced Electronic Circuit Design

Learning Outcome

Demonstrate the standard integrated circuit (IC) design techniques and chip implementation
Discuss the fundamental working principles of MOS devices for CMOS circuit design
Apply hierarchical design concept in CMOS circuit design and the physical implementation
Design CMOS combinational logic and sequential logic circuits
Implement the digital design functions using FPGA
Evaluate advanced semiconductor design problems on area optimisation, speed/delay trade-offs and low power design techniques
Assess semiconductor reliability issues and the failure mechanisms